The PID‑TZ‑C1 is a high-precision, computer-interfaced oven specifically designed for thermal testing and automated temperature profiling of electronic components and materials. This system integrates a PID (Proportional-Integral-Derivative) controller with PC connectivity, enabling real-time data acquisition, control, and logging of temperature parameters.

The system features a uniform heating chamber, high-quality thermal sensors (RTD/Thermocouple), and a USB or RS-232 interface for seamless communication with analysis software. It allows precise setting of thermal cycles, ramp rates, and dwell times—ideal for research labs, industrial QA, and academic electronics testing.

Key Features

• Digital PID controller with high accuracy and stability

• Computer interface (USB/RS-232) for real-time monitoring & control

• Software support for temperature programming, graph plotting, and data logging

• Temperature range: typically ambient to 300°C (customizable)

• Uniform thermal profile across the chamber

• Safety features: over-temperature protection, auto shutdown

• Ideal for long-term thermal aging and component reliability analysis

Applications

• Advanced thermal testing of electronic components

• Analysis of temperature coefficient, thermal drift, and degradation

• Research in semiconductor behavior under temperature stress

• Thermal cycling and reliability testing

• Teaching aid in physics, electronics, and material science labs

• Industrial quality assurance and process control