The PID‑CT is a precision-controlled oven designed specifically for thermal testing of electronic components using a PID (Proportional-Integral-Derivative) temperature controller. It provides a stable and accurate thermal environment, essential for studying the temperature-dependent behavior of semiconductor devices, resistors, capacitors, and other electronic components.

This unit includes a digital PID controller, heating chamber with uniform temperature distribution, temperature sensor (thermocouple or RTD), and component mounting area. The system allows users to precisely set and monitor temperature with tight tolerance, ensuring reliable and repeatable test results.

Perfect for engineering institutions, research laboratories, and QA/QC departments, the PID‑CT helps evaluate component performance under varied thermal conditions.

Key Features

• Closed-loop PID control for accurate and stable temperature regulation

• Temperature range: typically ambient to 250°C (customizable)

• Fast thermal response and uniform heat distribution

• Digital temperature display with real-time monitoring

• Includes component holder and temperature probe

• Safety features: over-temperature cutoff, insulated enclosure

• Suitable for thermal cycling and long-duration thermal stress tests

Applications

• Thermal characterization of semiconductors and passive components

• Temperature coefficient analysis

• Reliability testing and thermal aging studies

• Component testing for R&D, quality assurance, and academic labs

• Simulation of operating environments in automotive, aerospace, and electronics industries