The MRX‑RMC is an advanced computer-interfaced magnetoresistance setup, tailored for high-precision research on magneto-transport properties in semiconductors and semimetals. Building upon the MRX‑RM platform, this model includes full computer data acquisition and control, enabling real-time visualization and high-resolution analysis of resistance variations under magnetic fields.
Equipped with a four-probe arrangement for eliminating contact resistance errors, the MRX‑RMC allows automated measurements of resistance vs. magnetic field with accurate magnetic field calibration using a digital Gaussmeter interface. The system supports automated field sweeping, temperature variation (optional), and USB or serial interface for seamless integration with lab data systems.
This setup is ideal for advanced university laboratories, semiconductor device research, and material science R&D where precision, repeatability, and digital data acquisition are critical.
Computer-interfaced four-probe measurement system
Real-time data logging of resistance vs. magnetic field
Compatible with digital Gaussmeters and programmable electromagnets
Supports semiconductor and semimetal samples (e.g., GaAs, Ge, Bismuth)
Optional temperature control module for low-temperature studies
USB/RS232 interface with dedicated software for automated measurement
High repeatability and data accuracy for research publication standards
Advanced studies of magnetoresistance and Hall effects
Real-time research in carrier mobility and scattering analysis
Materials characterization in solid-state physics and electronics
Investigations in spintronics, semiconductors, and low-dimensional materials
Ideal for PhD and postgraduate-level research laboratories
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