The MRX‑RM is a high-precision research-grade magnetoresistance setup designed for advanced experimental analysis of semiconductor and semimetal samples under varying magnetic fields. Engineered with accuracy and flexibility in mind, this system allows users to investigate the magnetic field dependence of resistivity in different materials using a four-probe configuration, which ensures precise measurements by minimizing contact resistance.
It supports integration with digital Gaussmeters, programmable power supplies, and high-stability electromagnets, making it suitable for temperature-variable, low-field, or high-field magnetoresistance studies. The MRX‑RM offers extended compatibility with both n-type and p-type semiconductors like GaAs, InSb, or Ge, and metallic systems such as Bismuth.
This model is ideal for academic research laboratories, R&D centers, and postgraduate education focused on magneto-transport phenomena and spintronic applications.
Research-grade configuration with enhanced stability and sensitivity
Supports high-resolution four-probe measurements
Accommodates multiple semiconductor/semimetal samples
Wide compatibility with digital Gaussmeters, electromagnets, and data logging systems
Optional temperature control for low-temperature studies
Enables detailed analysis of carrier mobility, Hall effect, and magnetoresistance ratios
Built for long-term experimental research and characterization
In-depth research in magnetoresistance and Hall effect
Investigation of spintronic and magneto-electronic materials
Study of carrier scattering and mobility in different materials
Characterization of semiconductors, semimetals, and topological materials
Ideal for M.Sc., M.Tech, PhD research, and industry R&D
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