The HEX‑33C is a computer-interfaced Hall Effect setup designed to study the fundamental properties of semiconductors through the measurement of Hall voltage, Hall coefficient, and carrier concentration. This advanced system integrates real-time data acquisition capabilities via USB and includes user-friendly software for automated measurements, graphing, and analysis.

Equipped with a high-sensitivity Hall probe (Ge or GaAs), electromagnet with power supply, digital Gaussmeter, and sample holder, the HEX‑33C offers enhanced accuracy and repeatability. The built-in software interface allows students and researchers to visualize the effects of magnetic fields on charge carriers and extract key semiconductor properties efficiently.

This setup is ideal for engineering and physics departments seeking to modernize their solid-state physics experiments.

🔧 Key Features

• Computer Interface via USB for live data acquisition

• Compatible software for plotting and exporting Hall voltage vs. magnetic field

• High-sensitivity Hall probe (Ge/GaAs)

• Integrated Digital Gaussmeter for accurate magnetic field measurement

• Constant current source with digital control

• Determination of carrier type, Hall coefficient, and carrier mobility

• Compact and durable bench-top system

Applications

• Real-time analysis of Hall voltage and magnetic field relationship

• Determination of semiconductor type (n-type or p-type)

• Calculation of carrier concentration and mobility

• Academic demonstrations in solid-state electronics and condensed matter physics

• Laboratory experiments involving magneto-transport measurements