The Hall Probe (Ge-Crystal) is a high-sensitivity semiconductor sensor designed for use in Hall effect experiments to measure magnetic field strength and analyze carrier concentration and type in germanium materials. This probe uses a germanium crystal, which is highly responsive to applied magnetic fields, making it ideal for educational and research applications in solid-state physics and semiconductor characterization.
Typically used in conjunction with a Hall Effect Setup and digital Gaussmeter, this probe allows for precise measurement of the Hall voltage when a current-carrying conductor is placed in a perpendicular magnetic field.
Key Features:
High-sensitivity Hall sensor using germanium crystal
Suitable for N-type or P-type Hall effect studies
Compatible with standard Hall effect experimental kits
Accurately detects magnetic field strength via Hall voltage
Ideal for undergraduate and postgraduate lab experiments
Durable probe housing with labeled connections
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