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The Hall Probe (Ge-Crystal) is a high-sensitivity semiconductor sensor designed for use in Hall effect experiments to measure magnetic field strength and analyze carrier concentration and type in germanium materials. This probe uses a germanium crystal, which is highly responsive to applied magnetic fields, making it ideal for educational and research applications in solid-state physics and semiconductor characterization. Typically used in conjunction with a Hall Effect Setup and digital Gaussmeter, this probe allows for precise measurement of the Hall voltage when a current-carrying conductor is placed in a perpendicular magnetic field. Key Features:
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