The HEX‑21C is a modern, computer-interfaced Hall Effect experimental setup designed to study the behavior of charge carriers in semiconductors. It enables precise determination of key parameters such as Hall voltage, Hall coefficient, carrier concentration, and type of semiconductor (n-type or p-type).

Equipped with a high-sensitivity GaAs Hall probe, constant current source, electromagnet, and digital Gaussmeter, the setup connects seamlessly with a PC via USB interface and includes compatible data acquisition software for real-time plotting, data logging, and analysis.

This advanced model is ideal for university-level physics and electronics labs, offering accurate and user-friendly investigation of the Hall Effect in a range of materials.

🔧 Key Features

• GaAs Hall Probe with high sensitivity

• Computer Interface via USB for real-time data acquisition

• User-friendly Software for measurement, plotting, and export

• Electromagnet with regulated power supply

• Digital Gaussmeter for accurate magnetic field measurement

• Determination of Carrier Type & Concentration

• Automatic or Manual Sweep of Magnetic Field

• Suitable for n-type and p-type semiconductors

Applications

• Measurement of Hall Voltage and Hall Coefficient

• Determination of carrier concentration and mobility

• Identification of semiconductor type (n-type or p-type)

• Study of magnetic field effects on semiconductors

• Academic research and practical demonstrations in solid-state physics